XSWIR Hyperspectral Imaging

The Hinalea XSWIR Series captures rich spectral data across an extended shortwave infrared range and consists of the following models:

• XSWIR PRO is Hinalea’s versatile extended-SWIR hyperspectral imaging platform, providing 1120–2100 nm coverage in a compact, front-staring system. Its tunable Fabry-Pérot Interferometer captures complete two-dimensional images at each wavelength without mechanical scanning, while application-specific wavelength selection supports workflows from comprehensive spectral acquisition to near real-time imaging and classification. Designed for laboratory research, industrial inspection, and machine vision integration, XSWIR PRO balances extended spectral reach, acquisition flexibility, and portability for a broad range of material-analysis applications.
• XSWIR ULTRA is Hinalea’s highest-range XSWIR hyperspectral imaging platform, extending spectral coverage from 1000–2500 nm for applications requiring access to the full extended shortwave infrared region. Its tunable Fabry-Pérot Interferometer captures complete two-dimensional images at each wavelength without mechanical scanning, while application-specific wavelength selection supports both comprehensive spectral characterization and selected-band acquisition. Positioned above XSWIR PRO where maximum spectral reach is required, XSWIR ULTRA combines extended wavelength coverage with Hinalea’s full-frame imaging architecture for demanding laboratory, industrial, and advanced materials applications.